Terrestrial radiation effects in ULSI devices and electronic systems
(eBook)
Author
Published
Singapore : IEEE :, 2015.
Physical Desc
1 online resource (295 pages) : illustrations
Status
More Details
Format
eBook
Language
English
ISBN
9781118479315 (e-book)
Notes
Bibliography
Includes bibliographical references at the end of each chapters and index.
Description
Loading Description...
Also in this Series
Checking series information...
Reviews from GoodReads
Loading GoodReads Reviews.
Citations
APA Citation, 7th Edition (style guide)
Ibe, E. H. (2015). Terrestrial radiation effects in ULSI devices and electronic systems . IEEE :.
Chicago / Turabian - Author Date Citation, 17th Edition (style guide)Ibe, Eishi H.. 2015. Terrestrial Radiation Effects in ULSI Devices and Electronic Systems. IEEE.
Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)Ibe, Eishi H.. Terrestrial Radiation Effects in ULSI Devices and Electronic Systems IEEE, 2015.
MLA Citation, 9th Edition (style guide)Ibe, Eishi H.. Terrestrial Radiation Effects in ULSI Devices and Electronic Systems IEEE :, 2015.
Note! Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy. Citation formats are based on standards as of August 2021.
Staff View
Grouped Work ID
53c17ee2-597e-853d-664f-67c39469e0cf-eng
Grouping Information
| Grouped Work ID | 53c17ee2-597e-853d-664f-67c39469e0cf-eng |
|---|---|
| Full title | terrestrial radiation effects in ulsi devices and electronic systems |
| Author | ibe eishi h |
| Grouping Category | book |
| Last Update | 2022-06-07 21:23:19PM |
| Last Indexed | 2024-05-25 03:41:35AM |
Book Cover Information
| Image Source | syndetics |
|---|---|
| First Loaded | Oct 13, 2022 |
| Last Used | Jun 20, 2023 |
Marc Record
| First Detected | Aug 09, 2021 12:36:00 PM |
|---|---|
| Last File Modification Time | Nov 22, 2021 08:55:18 AM |
MARC Record
| LEADER | 02128nam a2200469 i 4500 | ||
|---|---|---|---|
| 001 | EBC1911831 | ||
| 003 | MiAaPQ | ||
| 006 | m E | | ||
| 007 | cr cnu|||||||| | ||
| 008 | 150123t20152015si a ob 001 0 eng d | ||
| 020 | |z 9781118479292 | ||
| 020 | |a 9781118479315 (e-book) | ||
| 035 | |a (Sirsi) EBC1911831 | ||
| 035 | |a (Sirsi) EBC1911831 | ||
| 035 | |a (MiAaPQ)EBC1911831 | ||
| 035 | |a (Au-PeEL)EBL1911831 | ||
| 035 | |a (CaPaEBR)ebr11004204 | ||
| 035 | |a (CaONFJC)MIL690579 | ||
| 035 | |a (OCoLC)899942102 | ||
| 040 | |a MiAaPQ|b eng|c MiAaPQ|d MiAaPQ|e rda|e pn | ||
| 050 | 4 | |a TK7870.285|b .I24 2015 | |
| 082 | 0 | |a 621.3815|2 23 | |
| 100 | 1 | |a Ibe, Eishi H.,|e author. | |
| 245 | 1 | 0 | |a Terrestrial radiation effects in ULSI devices and electronic systems |h [eBook]/|c Eishi H. Ibe. |
| 264 | 1 | |a Singapore :|b IEEE :|b Wiley,|c 2015. | |
| 264 | 4 | |c ©2015 | |
| 300 | |a 1 online resource (295 pages) :|b illustrations | ||
| 336 | |a text|2 rdacontent | ||
| 337 | |a computer|2 rdamedia | ||
| 338 | |a online resource|2 rdacarrier | ||
| 504 | |a Includes bibliographical references at the end of each chapters and index. | ||
| 588 | |a Description based on print version record. | ||
| 650 | 0 | |a Electronic circuits|x Effect of radiation on. | |
| 650 | 0 | |a Integrated circuits|x Ultra large scale integration|x Reliability. | |
| 650 | 0 | |a Integrated circuits|x Effect of radiation on. | |
| 655 | 4 | |a Electronic books. | |
| 776 | 0 | 8 | |i Print version:|a Ibe, Eishi H.|t Terrestrial radiation effects in ULSI devices and electronic systems.|d Singapore : IEEE : Wiley, c2015 |h xxiv, 268 pages |z 9781118479292 |w 2014022262 |
| 797 | 2 | |a ProQuest (Firm) | |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/yavapai-ebooks/detail.action?docID=1911831|x Yavapai College|y Yavapai College users click here to access |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/prescottcollege-ebooks/detail.action?docID=1911831|x Prescott College|y Prescott College users click here to access |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/yln-ebooks/detail.action?docID=1911831|x Yavapai Library Network|y All other users click here to access |
| 945 | |a E-Book | ||
