Radiation effects and soft errors in integrated circuits and electronic devices
(eBook)

Book Cover
Average Rating
Published
Singapore ; New Jersey : World Scientific Pub., c2004.
Physical Desc
viii, 339 pages : ill.
Status

More Details

Format
eBook
Language
English

Notes

General Note
Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.
Bibliography
Includes bibliographical references.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

Description

Loading Description...

Also in this Series

Checking series information...

More Like This

Loading more titles like this title...

Reading Recommendations & More

Citations

APA Citation, 7th Edition (style guide)

Schrimpf, R. D., & Fleetwood, D. M. (2004). Radiation effects and soft errors in integrated circuits and electronic devices . World Scientific Pub..

Chicago / Turabian - Author Date Citation, 17th Edition (style guide)

Schrimpf, Ronald Donald and D. M. Fleetwood. 2004. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. World Scientific Pub.

Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)

Schrimpf, Ronald Donald and D. M. Fleetwood. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices World Scientific Pub, 2004.

MLA Citation, 9th Edition (style guide)

Schrimpf, Ronald Donald., and D. M Fleetwood. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices World Scientific Pub., 2004.

Note! Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy. Citation formats are based on standards as of August 2021.

Staff View

Grouped Work ID
dd69e5e3-c5c3-584e-e9a3-6f6d39911188-eng
Go To Grouped Work

Grouping Information

Grouped Work IDdd69e5e3-c5c3-584e-e9a3-6f6d39911188-eng
Full titleradiation effects and soft errors in integrated circuits and electronic devices
Authorr d schrimpf d m fleetwood
Grouping Categorybook
Last Update2023-06-28 10:31:55AM
Last Indexed2024-04-30 05:45:08AM

Book Cover Information

Image Sourcedefault
First LoadedJul 5, 2022
Last UsedSep 15, 2023

Marc Record

First DetectedAug 09, 2021 12:31:27 PM
Last File Modification TimeNov 22, 2021 08:46:34 AM

MARC Record

LEADER02101nam a2200445Ia 4500
001EBC1679457
003MiAaPQ
006m    E |      
007cr cn|||||||||
008060316s2004    si a    sb    000 0 eng d
010 |z  2006273469
020 |z 9789812389404
020 |z 9812389407
035 |a (Sirsi) EBC1679457
035 |a (Sirsi) EBC1679457
035 |a (MiAaPQ)EBC1679457
035 |a (Au-PeEL)EBL1679457
035 |a (CaPaEBR)ebr10255983
035 |a (CaONFJC)MIL193459
035 |a (OCoLC)879074235
040 |a MiAaPQ|c MiAaPQ|d MiAaPQ
050 4|a TK7870.285|b .R33 2004
24500|a Radiation effects and soft errors in integrated circuits and electronic devices|h [eBook] /|c editors, R.D. Schrimpf, D.M. Fleetwood.
260 |a Singapore ;|a New Jersey :|b World Scientific Pub.,|c c2004.
300 |a viii, 339 p. :|b ill.
4901 |a Selected topics in electronics and systems ;|v vol. 34
500 |a Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.
504 |a Includes bibliographical references.
533 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0|a Electronic circuits|x Effect of radiation on.
650 0|a Integrated circuits|x Effect of radiation on.
655 4|a Electronic books.
7001 |a Schrimpf, Ronald Donald.
7001 |a Fleetwood, D. M.|q (Dan M.)
7102 |a ProQuest (Firm)
830 0|a Selected topics in electronics and systems ;|v vol. 34.
85640|u http://ebookcentral.proquest.com/lib/yavapai-ebooks/detail.action?docID=1679457|x Yavapai College|y Yavapai College users click here to access
85640|u http://ebookcentral.proquest.com/lib/prescottcollege-ebooks/detail.action?docID=1679457|x Prescott College|y Prescott College users click here to access
85640|u http://ebookcentral.proquest.com/lib/yln-ebooks/detail.action?docID=1679457|x Yavapai Library Network|y All other users click here to access
945 |a E-Book