Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability
(eBook)
Contributors
Published
[River Edge, NJ] : World Scientific, c2002.
Physical Desc
ix, 270 pages : ill.
Status
More Details
Format
eBook
Language
English
Notes
Bibliography
Includes bibliographical references.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
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Citations
APA Citation, 7th Edition (style guide)
Dumin, D. J. (2002). Oxide reliability: a summary of silicon oxide wearout, breakdown, and reliability . World Scientific.
Chicago / Turabian - Author Date Citation, 17th Edition (style guide)Dumin, D. J. 2002. Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability. World Scientific.
Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)Dumin, D. J. Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability World Scientific, 2002.
MLA Citation, 9th Edition (style guide)Dumin, D. J. Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability World Scientific, 2002.
Note! Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy. Citation formats are based on standards as of August 2021.
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Grouped Work ID
6c879796-7bac-d76e-57fd-94d52f579924-eng
Grouping Information
| Grouped Work ID | 6c879796-7bac-d76e-57fd-94d52f579924-eng |
|---|---|
| Full title | oxide reliability a summary of silicon oxide wearout breakdown and reliability |
| Author | d j dumin |
| Grouping Category | book |
| Last Update | 2022-06-07 21:23:19PM |
| Last Indexed | 2024-04-30 04:03:36AM |
Book Cover Information
| Image Source | default |
|---|---|
| First Loaded | Mar 18, 2024 |
| Last Used | Mar 18, 2024 |
Marc Record
| First Detected | Aug 09, 2021 12:31:26 PM |
|---|---|
| Last File Modification Time | Nov 22, 2021 08:46:34 AM |
MARC Record
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| 050 | 4 | |a TK7871.99.M44|b O95 2002 | |
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| 245 | 0 | 0 | |a Oxide reliability|h [eBook] :|b a summary of silicon oxide wearout, breakdown, and reliability /|c editor, D.J. Dumin. |
| 260 | |a [River Edge, NJ] :|b World Scientific,|c c2002. | ||
| 300 | |a ix, 270 p. :|b ill. | ||
| 490 | 1 | |a Selected topics in electronics and systems ;|v v. 23 | |
| 504 | |a Includes bibliographical references. | ||
| 533 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Metal oxide semiconductors|x Reliability. | |
| 650 | 0 | |a Silicon oxide|x Deterioration. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Dumin, D. J. | |
| 710 | 2 | |a ProQuest (Firm) | |
| 830 | 0 | |a Selected topics in electronics and systems ;|v v. 23. | |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/yavapai-ebooks/detail.action?docID=1679439|x Yavapai College|y Yavapai College users click here to access |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/prescottcollege-ebooks/detail.action?docID=1679439|x Prescott College|y Prescott College users click here to access |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/yln-ebooks/detail.action?docID=1679439|x Yavapai Library Network|y All other users click here to access |
| 945 | |a E-Book | ||
