Detecting lies and deceit : pitfalls and opportunities
(Book - Regular Print)
Author
Published
Chichester ; John Wiley, [2008].
Edition
Second edition.
Physical Desc
xii, 488 pages : illustrations ; 23 cm.
Status
Embry Riddle Aero University - CIRCCOLL - Circulating Collection
HV8076.V75 2008
1 available
HV8076.V75 2008
1 available
More Details
Published
Chichester ; John Wiley, [2008].
Format
Book - Regular Print
Edition
Second edition.
Language
English
Notes
Bibliography
Includes bibliographical references (pages 421-482) and index.
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Copies
Location | Call Number | Status |
---|---|---|
Embry Riddle Aero University - CIRCCOLL - Circulating Collection | HV8076.V75 2008 | Find It Now |
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Citations
APA Citation, 7th Edition (style guide)
Vrij, A. (2008). Detecting lies and deceit: pitfalls and opportunities (Second edition.). John Wiley.
Chicago / Turabian - Author Date Citation, 17th Edition (style guide)Vrij, Aldert. 2008. Detecting Lies and Deceit: Pitfalls and Opportunities. John Wiley.
Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)Vrij, Aldert. Detecting Lies and Deceit: Pitfalls and Opportunities John Wiley, 2008.
MLA Citation, 9th Edition (style guide)Vrij, Aldert. Detecting Lies and Deceit: Pitfalls and Opportunities Second edition., John Wiley, 2008.
Note! Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy. Citation formats are based on standards as of August 2021.
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