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On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond

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Author

Rumiantsev, Andrej

Publisher

River Publishers

Publication Date

[2019]

Language

English

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ISBN

9788770221115

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Characterization
Electronic books
Semiconductors
Semiconductors -- Characterization

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On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond

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